Metrology and inspection is the most important step that let manufacturers manage yield throughout the entire fabrication process, let it be research and development or the final volume production. These solutions are used in various industries like data storage manufacturing, solar process development and control, mask manufacturing, medical device manufacturing and general materials research.
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Professionals face many obstructions on site. Whatever the levelling challenge, Leica NA320 levels overcome. Rely on the known expertise of Leica Geosystems for the best quality and performance. On your terms, on your site, Leica Geosystems and the Leica NA 320 Optical Levels are your trusted partners for accurate measurements every time.
UNIQUE DESIGN Whether you’re facing basic demands or you need more support, the unique design of the Leica NA300 Series of automatic (optical) levels can meet you wherever you are in the building and construction field. With a better protected shape, these rugged levels offer increased ergonomic handling while ensuring you receive the highest quality results at the best price value.
ACCURATE Leica NA320 levels have been engineered for daily levelling tasks. Whatever the need, these levels measure with the highest precision and accuracy. These automatic (optical) levels provide the highest in both while being ergonomic in their handling and rugged for daily use in the harshest conditions.
SIMPLE A perfectly designed mirror makes it extremely easy to adjust the horizontal level with the highest possible accuracy and confidence. The Leica NA320 dumpy levels – along with all our automatic (optical) levels – are made for everyday use for any site.
PROTECTED Leica Geosystems offers unbeaten service with all of its NA Series levels. The IP54 standard ensures the highest quality measurements even in the most challenging environments.
The 3D Tester stands out with its robust structure and slim and attractive design. Its precise and versatile capabilities enable fast and easy calculation of workpiece reference points and lengths. Probing is possible in all axle directions (X/Y/Z) at the same indicator resolution.